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This is my weekly assignment, and the topic of this week is about Electron Microscopy.
"All you wanted to know about Electron Microscopy" is a booklet on electron microscope. This handbook was published by FEI Company, which is one of the main suppliers of Transmission and Scanning Electron Microscopes. The schemas of different microscopes are introduced in the booklet. As technology advances, the instruments have better magnifications. After reading the booklet, I have learned more about the microscope. Each microscope has several different advantages or disadvantages. A thin specimen is required for a TEM, and most SEM samples need to be coated to make them conductive. I gained the knowledge of how to choose a suitable microscope from this assignment.
A microscope is used to observe samples that the unaided eye cannot see.
A Transmission Electron Microscope (TEM) allows electrons to go through a sample and onto a projector where the sample’s image is magnified. However, the component inside the sample might be distinct from the sample’s surface, and sometimes we need information about the surface. A Scanning Electron Microscope (SEM) is an instrument used to get an image of sample’s surface. The disadvantage of SEMs is that the electron beam used to scan the sample’s surface may damage the sample. An example from my experience, after we had chance to use SEM, the sample’s surface was not the same as when we had loaded it. Thus it matched the literature. Since TEM and SEM have different purposes, Scanning Transmission Electron Microscopy combines the advantages of both TEM and SEM. The process of STEM is to scan electrons through the sample. Because these three microscopes require a vacuum chamber, the microscope cannot be used to observe the activity sample. As a result, an advanced microscope is created. An Environmental Scanning Electron Microscope can observe a wet sample or a sample not coated with an electrically-conductive layer.
Since each sample has distinguishing characteristics, it is important to select the correct microscope to analyze the material. This is a very helpful booklet, which contains an orientation to the manipulation of samples. It is too much for me to absorb all at once, but at least I know where I can find out some information about microscope.
Microscope is a useful device in science. In the past, it was used to observe the sample, but nowadays it can be used very widely to analyze the component or the structure. This was a great chance for me to understand how to choose the appropriate microscope for different situations. Understanding this knowledge will benefit me in the future. I want to explore the microscopic world of nanoscale objects. Since the electron microscopy techniques have been greatly improved, it supports to meet the desire of the nanomaterial world.
"All you wanted to know about Electron Microscopy" is a booklet on electron microscope. This handbook was published by FEI Company, which is one of the main suppliers of Transmission and Scanning Electron Microscopes. The schemas of different microscopes are introduced in the booklet. As technology advances, the instruments have better magnifications. After reading the booklet, I have learned more about the microscope. Each microscope has several different advantages or disadvantages. A thin specimen is required for a TEM, and most SEM samples need to be coated to make them conductive. I gained the knowledge of how to choose a suitable microscope from this assignment.
A microscope is used to observe samples that the unaided eye cannot see.
A Transmission Electron Microscope (TEM) allows electrons to go through a sample and onto a projector where the sample’s image is magnified. However, the component inside the sample might be distinct from the sample’s surface, and sometimes we need information about the surface. A Scanning Electron Microscope (SEM) is an instrument used to get an image of sample’s surface. The disadvantage of SEMs is that the electron beam used to scan the sample’s surface may damage the sample. An example from my experience, after we had chance to use SEM, the sample’s surface was not the same as when we had loaded it. Thus it matched the literature. Since TEM and SEM have different purposes, Scanning Transmission Electron Microscopy combines the advantages of both TEM and SEM. The process of STEM is to scan electrons through the sample. Because these three microscopes require a vacuum chamber, the microscope cannot be used to observe the activity sample. As a result, an advanced microscope is created. An Environmental Scanning Electron Microscope can observe a wet sample or a sample not coated with an electrically-conductive layer.
Since each sample has distinguishing characteristics, it is important to select the correct microscope to analyze the material. This is a very helpful booklet, which contains an orientation to the manipulation of samples. It is too much for me to absorb all at once, but at least I know where I can find out some information about microscope.
Microscope is a useful device in science. In the past, it was used to observe the sample, but nowadays it can be used very widely to analyze the component or the structure. This was a great chance for me to understand how to choose the appropriate microscope for different situations. Understanding this knowledge will benefit me in the future. I want to explore the microscopic world of nanoscale objects. Since the electron microscopy techniques have been greatly improved, it supports to meet the desire of the nanomaterial world.
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