工欲善其事必先利其器，是我對教授指定我們閱讀這些參考文件的最佳解讀～畢竟要先看是需應用在哪個領域才能選擇適合分析的使用工具，這次指定閱讀的內容是介紹電子顯微鏡，它細分為很多種，而日後將用在我的專題的是ＳＴＥＭ。
“Materials Advances through Aberration-Corrected Electron Microscopy” is an article from the magazine MRS BULLETIN. The authors of the article were S. J. Pennycook, M. Varela, C.J.D. Hetherington and A. I. Kirkland. Since Richard Feynman gave the lecture “ There is plenty of Room at the Bottom,” scientists have worked intensively on the resolution of the electron microscope. The authors present two designs of aberration correctors available for electron microscopes. The FEI microscopy booklet from last week’s class talked about these instruments, but this article has a little more information about them. In this article there are more details and cases studies about aberration correction in two specific microscopes: STEMs (scanning transmission electron microscopes) and CTEMs (conventional transmission electron microscopes).
Both STEMs and CTEMs now have aberration correctors available, which have the same purpose in improving interpretable resolution and reducing image delocalization. They work by allowing the objective lens aperture to be increased, which increases the spatial resolution. The depth resolution of an aberration-corrected 300-kv STEM is at the nanometer scale. This is interesting because it allows researchers to create a three-dimensional data set similar to one made with confocal microscopes.
With aberration correctors, the application of nanotechnology can be upgraded to a better level. For example, defects in semiconductors can be found more easily and in better detail. Another example is that in superconductors, better microscope images can help identify which parts of the material are responsible for its superconductive property. One final example is that in Si3N4 ceramics, rare-earth elements are used to make materials together but different elements cause different effects. Better microscopy can help to see how the atoms are working and will help produce better ceramics. These types of advances will be a great benefit to factories.
This article introduces two types of electron microscopes with aberration correction and it also presents how they can be used. I think that it is important to have more knowledge of these microscopes. Since microscopes are widely-used tools, this is a great opportunity to gain more knowledge of them. As the size of materials becomes smaller, I think that it is important to have advanced technology for analyzing the defects in different materials. Since STEM and CTEM can provide an economical and convenient method, they will help develop the next generation of nano-scale devices.
“Materials Advances through Aberration-Corrected Electron Microscopy” is an article from the magazine MRS BULLETIN. The authors of the article were S. J. Pennycook, M. Varela, C.J.D. Hetherington and A. I. Kirkland. Since Richard Feynman gave the lecture “ There is plenty of Room at the Bottom,” scientists have worked intensively on the resolution of the electron microscope. The authors present two designs of aberration correctors available for electron microscopes. The FEI microscopy booklet from last week’s class talked about these instruments, but this article has a little more information about them. In this article there are more details and cases studies about aberration correction in two specific microscopes: STEMs (scanning transmission electron microscopes) and CTEMs (conventional transmission electron microscopes).
Both STEMs and CTEMs now have aberration correctors available, which have the same purpose in improving interpretable resolution and reducing image delocalization. They work by allowing the objective lens aperture to be increased, which increases the spatial resolution. The depth resolution of an aberration-corrected 300-kv STEM is at the nanometer scale. This is interesting because it allows researchers to create a three-dimensional data set similar to one made with confocal microscopes.
With aberration correctors, the application of nanotechnology can be upgraded to a better level. For example, defects in semiconductors can be found more easily and in better detail. Another example is that in superconductors, better microscope images can help identify which parts of the material are responsible for its superconductive property. One final example is that in Si3N4 ceramics, rare-earth elements are used to make materials together but different elements cause different effects. Better microscopy can help to see how the atoms are working and will help produce better ceramics. These types of advances will be a great benefit to factories.
This article introduces two types of electron microscopes with aberration correction and it also presents how they can be used. I think that it is important to have more knowledge of these microscopes. Since microscopes are widely-used tools, this is a great opportunity to gain more knowledge of them. As the size of materials becomes smaller, I think that it is important to have advanced technology for analyzing the defects in different materials. Since STEM and CTEM can provide an economical and convenient method, they will help develop the next generation of nano-scale devices.
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